|
Diehard Battery of Tests of Randomness v0.2 beta
|
||
|
This is a temporary website to handle requests for a new version of tests from the
first edition of with The Diehard Battery of Tests of Randomness A new edition of that CDROM will soon be released, and it will contain new versions of the DIEHARD Battery of Tests. Those tests will be pretty much in the form that you will get from here, with possible modifications that may arise from your feedback. For any feeback, please mail to: diehard@csis.hku.hk |
||
|
A new edition of the CDROM is being developed at The University of Hong Kong, under support from The Innovation and Technology Commission, HKSAR Government, under the titles "Vulnerability Analysis Tools for Cryptographic Keys (ITS/227/00)" |