Proceedings of the 1st Asia-Pacific Conference on Quality Software (APAQS '00),
IEEE Computer Society, Los Alamitos, CA, pp. 149-155 (2000)

On the Completeness of Test Cases
for Atomic Arithmetic Expressions

T.H. Tse 2 , T.Y. Chen 3 , and X. Feng 4

[paper from IEEE Xplore | paper from IEEE digital library | postprint]


Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper, we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary "++" or "--", then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary.

Keywords: Arithmetic expressions, completeness of test cases, mutation operators, mutation testing, software testing.

1. This research is supported in part by a grant of the Research Grants Council of Hong Kong and a research and conference grant of The University of Hong Kong.
2. (Corresponding author.)
Department of Computer Science, The University of Hong Kong, Pokfulam, Hong Kong.
3. Centre for Software Analysis and Testing, Swinburne University of Technology, Hawthorn 3122, Australia. (Part of the work was carried out when Chen was with the Vocational Training Council, Hong Kong.)
4. Department of Computer Science, The University of Hong Kong


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