IEEE Computer 45 (6): 64-71 (2012) |
Zhenyu Zhang 2 , W.K. Chan 3 , and T.H. Tse 4
[paper
from IEEE Xplore
|
paper
from IEEE digital library
|
technical
report TR-2012-04]
ABSTRACT |
Fault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. |
|
EVERY VISITOR COUNTS: |